|
장치기본
Spec.
|
|
측정칩종류
및
사이즈
|
MLCC，
1005,
1608,
2012,
3216.
|
|
Test
Stations수량
|
6
test
stations(standard),
7
test
stations(option)
|
|
Test
Stations타입
|
Cp/D,HV(flash),
Pre-charge1,IR1,
Pre-charge2,
IR2
(standard)
|
|
Contact
|
Roll
contacts
for
Cp/D
test,
HV/IR
test
|
|
Test
Handling
Concept
|
Multi-station
serial
testing
|
|
Quantity
of
Output
Bins
|
Total
22
sets,
on
both
sides(one
side
11
sets)
|
|
배출통
수량
및
분류
|
5
bins
for
Cp
value
sorting
5
bins
for
reject
categories
1.Cp
Out
2.Df
Reject
3.HV
Reject
4.IR
Reject
5.No
contact
One
clean-off
bin
|
|
배출통용량
|
Cp/D
bins:
More
than
2500K
(0402)Reject
bins:
More
than
600K
(0402)
|
|
Input타입
|
Bulk
feeder
assembly
|
|
Output타입
|
Bulk
sort
bins
|
|
Feeder속도
|
3000Kpcs/hr
(1005)
|
|
측정속도
|
280Kpcs/hr(charge
time에
따라
약간의
차이가
있음)
|
|
측정용
Meter
|
|
Cp/D
Testing
Devices
|
3
sets
of
Agilent
4288A
for
Cp/D
test
(With
scanner)
|
|
HV
Power
Supply
|
Test
Voltage
:
1-700V
Direct
Current
Charge
Current
:
1~30
mA(Step
1)
Charging
Time:
User
Setting
Voltage
Accuracy:
0.2%
of
Rating
Ripple:
0.02%
Eo
max
|
|
IR
Power
Supply
|
Test
Voltage
:
1
~
500V
Direct
Current
Charge
Current
:
1
~
50
mA(Step
1)
Charging
Time:
User
SettingVoltage
Accuracy:
0.2%
of
Rating
Ripple:
0.02%
Eo
max
|
|
HV
Testing
Devices
|
2
sets
Agilent
4349B
4
Channel-Current
Mode
or
Resistor
Mode
|
|
IR
Testing
Devices
|
4
sets
Agilent
4349B
4
Channel-Current
Mode
or
Resistor
Mode
|
|
Operation환경
|
|
CPU
|
Intel
Celeron
1GHz
|
|
Memory
|
128MB
RAM
|
|
Magnetic
Disk
|
FDD:
3.5”
1.44MBHDD:
40GB
CD-ROM:
40xIDE
|
|
Operation
Interface
|
15”
LCD(1024x768)
Touch
Screen
|
|
Reserved
Power
|
2
KV
UPS
|
|
유틸리티
|
|
dimension
|
W1340mm
x
D1170mm
x
H2250mm
(Lamp
included
)About
700kg.
|
|
Power
|
AC
220V,
Single
Phase,
50/60Hz
15A
|
|
Air
Pressure
|
6kgf/cm^2
|
|
Vacuum
|
supplied
by
vacuum
pump
or
for
the
plant
vacuum
source
|
