SMART Search is an adaptive pattern locating tool designed specifically to advance the robustness and accuracy of
precision alignment, registration, and inspection applications.
SMART, which stands for Subpixel Alignment and Registration Tool, incorporates a highly innovative new method that has
proven to be extremely reliable in locating the position and orientation of objects despite highly degraded run-time patterns
or images.
SMART Search locates patterns and maintains high precision despite changes in object/pattern size, orientation, shape,
focus, or partial occlusion.
By adapting to demanding process variations while maintaining fast and accurate pattern locating performance, SMART
Search is especially well suited for demanding alignment applications in semiconductor and electronics manufacturing
equipment, including CMP wafer handlers, wafer probers, wire bonders, IC test handlers, and pick and place machines.

• Adapts to process variations encountered in automated semiconductor & electronics manufacturing
• Returns 1/40th pixel accuracy despite substantial image degradation
• Built-in intelligence to improve robustness for highly reliable performance
• Pattern Training Wizard that takes the guesswork and tedium out of pattern training
• Fast applications development: Extensive demo source code gives you a framework for quickly developing
  your application
• Invariant to non-linear contrast gradients, reversal, or specular reflection for reliability under changing
  lighting conditions
• Performs accurately even when pattern features are missing or occluded
• Returns up to 360? angle orientation of located objects
• High accuracy results despite image degradation - no need to give up accuracy for robustness
• Fast pattern recognition despite image degradation - no need to give up speed for high accuracy and robustness