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Overview
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MCIS-Pro developed by RTS is high speed appearance inspection system with
our wide experience accumulated from research and development for many
years and able to inspect up to 4,000 chips in a minute with the best of
illumination technology, machinery mechanism and software.
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- New Design
- New cameras applied
- 4 and/or 6 sided inspection
- 2 PCs provides more stable image processing
- Speed of parts inserting improved
- Sensor for checking of index revolution
- Fast and strong discharge
- Monitoring system
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Features
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- Indexing on a glass
- Supplying parts by feeder
- Illumination optimized for NG pattern
- Strong Inspection Algorithm
- Accurate sorting of goods and defects
- Productivity : Max.4,000 ea/Min (Based on 1005)
- Newly advanced outlet and solenoid applied
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Features of Internal Composition
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Compact Size
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840*870*1,750(W*L*H)
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- Rotating
one
glass
table
- Sorting goods to the bins distinguished as good, bad and retest
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Flexible Functions
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- Automatic calibration of ejector and camera position
- Reports of pass/fail result recorded for review
- Programmable detection logic
- Functional parameter set-up
- Teaching help
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User Friendly Interface
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- History running mode : 4 side images displayed
- “Help” function supported per each parameter in 4 language( Chinese / English/ Japanese/ Korean)
- Saving function of inspection history
- Programmable(easy) illumination control
- Easy-to-operation & Easy-to-maintenances
- SPC Mode , MISC Mode
- Various reporting function
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Application
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- MLCC, MLCI, Chip-R Array, Varistor, Antenna Chip, Coil- Inductor, LTCC, Chip-LED, Array, PTC, Filter,
Power-Inductor and Various Ceramic/Micro Components
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Inspection of “Micro” Sized Parts
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- 0603, 1005, 1608, 2012, 3216, ... mm(0201, 0402, 0603, 0805, 1206, ... inch)
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High Speed
Inspection
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- Max. 4,000 chips/m (Based on 1005mm Chip Size)
- 4 and/or 6 sided inspection
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Chip Size Changeable
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- Two
near
sizes
(1005/1608,
1608/2012,
2012/3216)
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Inspection Item
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- Size Inspection
Length,
Width,
Thickness,
Termination
bandwidth
- Body Inspection
Chips, Crack, Internal electrode exposure, Blister, Burst,
Pin Hole, Scratches, Surface contamination, Discoloration
- Pole Inspection
Brokenness, Miss-plating, Holes, Scratches, Smears,
Existence, Surface contamination
- Defect Image
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Software
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Customer Centralized Operation System
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- System access from program
- Contrast/ Sharpness function
- Able to support graph
- Enforcement of data saving function
- Able to modify on main screen of INI file
- Fast & strong processing
- High speed imaging processing
- System controlled by PC
- Easy parameter setting
- Able to check system status by error messages
- Contrast/Sharpness function
- Max. 12 channels, auto control LED illumination
- Various event recording
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