HOME > Product > Microchip Inspection System > LCD Inspection > Cell Inspection

Overview

This inspection system detects particles and defects that could bring a serious loss to images of LCD on the process of
putting CF and TFT panel together and makes standard from those defects which are subjectively decided by human¡¯s
eye. The inspection items are Line-open, Lind-short, Partial Silk, Light Leak, Dot Spot, Mura, etc.

 

Features

  • Panel / module auto probe unit
  • Applied back light specially designed for inspection
  • Auto aligner (2 camera Interfaces)
  • Pattern (R.G.B, GRYA, White Pattern, etc.) generator interface
  • High resolution area scan CCD camera loaded
    (Resolution: Under 20u)
  • Each whole processing for defects distinguished as line, spot,
    mura, etc. and inspection algorithm applied.
    (Outstanding detection for minute defects)

Specifications

 

Items

LCD Panel and module cell
Inspection Line

Option: Panel Appearance
Inspection

Speed

8 sec/ea

Able to control speed per machine

Range

LCD Panel Size 1.8~2.2¡±

Different panel size supported per
each camera resolution

PC Specifications

Vision PC, Control PC
Windows2000
Pentium4 2.8G / Over 512RAM

 

Demension

900W X 950L X 1,500H

 

Weight

350kg

 

Utility

Input Power : AC220V 1phase

Additional air pressure line needed

 

Strong Points

  • The first cell inspection machine in the world
  • Machine stability realized examination standard in the production line
  • Excellent defect detection and accurate repetition
  • Customized machine per each request with flexible price

Diagram

 

 

Product Images

This inspection program has algorithm developed by RTS and GUI for customer¡¯s convenience. Also this displays the
screen of auto alignment, inspection for each pattern in real time, the inspection result, NG image and inspection yield.

 

¢º Defect Images